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Your search returned 10 records. Click on the hyperlinks to view further details of Titles.. |
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Magazine Name : Ieee Design And Test Of Computers
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Year : 2001 Volume number : 18 Issue: 03 |
Automatic Generation Of Parallel Crc Circuits
(Article)
Subject:
Automatic Generation Control
,
Parallel System
,
Crc Circuits
Author:
Michael
Sprachmann
page:
108
-
114
Design And Test Of Large Embedded Memories: An Overview
(Article)
Subject:
Design And Test
,
Embedded Memories
Author:
Rochit
Rajsuman
page:
16
-
27
Using Electrical Bitmap Results From Embedded Memory To Enhance Yield
(Article)
Subject:
Embedded Memories
,
Bit Map
,
Yield
Author:
Julie
Segal
page:
28
-
39
Guest Editors' Introduction: The New World Of Large Embedded Memories
(Article)
Subject:
Embeded Memory Blocks
Author:
Rochit
Rajsuman
page:
3
-
6
Random-Access Data Storage Components In Customized Architectures
(Article)
Subject:
Random Access
,
Storage Systems
Author:
Lode
Nachtergaele
page:
40
-
55
Data Memory Organization And Optimizations In Application-Specific Systems
(Article)
Subject:
Memory
,
Optimization
Author:
Preeti Ranjan
Panda
page:
56
-
69
Embedded Dram Development: Technology, Physical Design, And Application Issues
(Article)
Subject:
Embedded System
,
Technology
,
Physical Design
Author:
Doris
Keitel-Schulz
page:
7
-
15
Code Transformations For Data Transfer And Storage Exploration Preprocessing In Multimedia Processors
(Article)
Subject:
Exploration
,
Multimedia Netwok
Author:
Francky
Catthoor
page:
70
-
82
System-On-Chip Testability Using Lssd Scan Structures
(Article)
Subject:
System On Chip
,
Testability Using Lssd Scan Structures
Author:
Kamran
Zarrineh
page:
83
-
97
A Survey Of Digital Design Reuse
(Article)
Subject:
Digital Design
,
Survey
Author:
Margarida F
Jacome
page:
98
-
107
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